Total Silicon-HF

585

Total Silicon-HF

Si

Summary

This method quantitatively determines the concentration of silicon utilizing a nitric acid/hydrogen peroxide/hydrofluoric acid microwave digestion and analysis by Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES). The method has a detection limit of 0.01% and on homogeneous sample material is generally reproducible within 8% (relative).

Sample amount requested: 5 g (to allow for moisture determination)

Questions concerning limited sample size can be answered by the UC Davis Analytical Laboratory.

Feng, X., Wu, S., Wharmby, A., and Wittmeier, A. Microwave digestion of plant and grain standard reference materials in nitric and hydrofluoric acids for multi-elemental determination by inductively coupled plasma mass spectrometry. Journal of Analytical Atomic Spectrometry, 1999, 14, pp. 939-946.